◆Non-contact non-destructive measurement, two-dimensional perspective imaging
◆No coupling agent required
◆Imaging low-density materials while still retaining high contrast
◆Support high frequency probe (60-800GHz)
◆Measurement accuracy is not affected by ambient light and temperature
◆Repeated measurement error is less than 1%
◆Scanning speed: 7 minutes/image@1mm resolution
◆Low power consumption, no ionizing radiation hazard
◆ Automatic full inspection of production line
◆ Accurate ranging
◆ Accurate thickness measurement
◆ motion perception
◆ perspective imaging detection
◆ Chemical composition identification
| Penetration effect | resolution | Imaging features | Material analysis | |
|---|---|---|---|---|
| THz | medium | Medium, sub mm level |
Low-density materials have good imaging quality High precision of displacement and electrical characteristics |
Y |
| Ultrasonic Wave | powerful | Low, cm level |
Need coupling agent Poor imaging clarity Unable to measure electrical characteristics |
N |
| X-ray | powerful | High, μm level |
There is ionizing radiation Low-density materials have poor imaging layering Unable to measure displacement and electrical properties |
N |
| Millimeter Wave | medium | Low, mm level |
medium clarity Low accuracy of displacement and electrical characteristics |
Y |
